简体中文  |  English
Area1>>High-throughput Materials Computational Design and Software
Area2>>High-throughput Materials Fabrication and Characterization
Area3>>Materials Service Evaluation and Prediction
Area4>>MGE Databases and Data Technology
Area5>>MGE Applications

High-throughput Materials Characterization and Fabrication

Group Leader:Haizhou Wang

一、Published Paper


Paper

Journals

Time

Authors

1

Fast-FineCut: Grain boundary detection in microscopic images considering 3D information

Micron

2018.9

Boyuan Ma,Xiaojuan Ban,Ya Su,Chuni Liu,Hao Wang,Weihua Xue,Yonghong Zhi,Di Wu

2

A fast algorithm for material image sequential stitching

Computational Materials Science

2018.10

Boyuan Ma,Xiaojuan Ban,Haiyou Huang,Wanbo Liu,Chuni Liu,Di Wu,Yonghong Zhi

二、Application and authorization patent

(1)Authorization patent


Patent name

Patent authorization number

Completion person

Authorization date

1

High-throughput microfabrication method for multi-component materials

ZL201710946481.9

Haizhou Wang、Yunhai Jia、Lei Zhao、Xuebin Chen、Peng wang、Dongling Li、Guang Feng、Xiaojia Li

2018.10.9

2

Scanning particle beam microscope system

CN201720883782.7

Shuai Li、Wei He,Ruiping Wang

2018.2.16

3

Sample carrier for sample position calibration

CN201720854811.7

Wei He、Shuai Li、Ruiping Wang 

2018.6.15

4

Low energy scanning electron microscope system

CN201721565080.0

Shuai Li、Wei He

2018.5.29

5

Scanning electron microscope objective system

CN201820234897.8

Shuai Li、Wei He

2018.11.15

6

Scanning electron microscope system

CN201820888588.2

Shuai Li、Wei He、Ruiping Wang

2018.12.7

7

Imaging system

CN201821196445.1

Wei He、Shuai Li

2018.12.13

(2)Application patent


Patent

Patent authorization number

Completion person

Authorization date

1

A high throughput micro-synthesis method of multi-component materials

15912930(US)

Haizhou Wang、Yunhai Jia、Lei Zhao、Xuebin Chen、Peng Wang、Dongling Li、Guang Feng、Xiaojia Li

2018.3.6

2

A High Throughput Micro-synthesis Method of Multi-component Materials

10 2018 102 509.2(Germany)

Haizhou Wang、Yunhai Jia、Lei Zhao、Xuebin Chen、Peng Wang、Dongling Li、Guang Feng、Xiaojia Li

2018.2.5

3

Low voltage scanning electron microscope and method for specimen observation

PCT/CN2018/075564

Focus-

ebeam Technology (Beijing) Co., Ltd.

2018.2.7

4

Scanning electron microscope objective lens system and method for specimen observation

PCT/CN2018/085300

Focus-

ebeam Technology (Beijing) Co., Ltd.

2018.5.2

5

Imaging system and method for specimen detection

PCT/CN2018/103852

Focus-

ebeam Technology (Beijing) Co., Ltd.

2018.9.3

6

The invention relates to a high-flux gradient heat treatment array crucible

CN201710946491.2

Haizhou Wang;Yunhai Jia;Lei Zhao;Peng Wang;Xiaojia Li;Dongling Li;Xuebin Chen;Guang Feng

2017.10.12

7

A multi - channel honeycomb array crucible with gradient temperature field

CN201710946464.5

Haizhou Wang、Yunhai Jia、Lei Zhao、Peng Wang、Xiaojia Li、Dongling Li、Xuebin Chen、Guang Feng

2017.10.12

8

A multi - channel honeycomb array crucible with the same temperature field

CN201710946445.2

Haizhou Wang、Yunhai Jia、Lei Zhao、Peng Wang、Xiaojia Li、Dongling Li、Xuebin Chen、Guang Feng

2017.10.12

9

The invention relates to a hot isostatic high flux micro manufacturing method for composite materials and a jacket die thereof

CN201910014812.4

Haizhou Wang、Yunhai Jia、Lei Zhao、Xuebin Chen、Hui Wang、Man Hu、Guang Feng、Dongling LI、Peng Wang、Xiaojia LI

2019.1.8

10

A method for the quantitative statistical distribution of precipitated phase particles in metal materials with full field of view

CN201711469419.1

Dongling Li,Xuejing Shen,Lei Zhao,Haizhou Wang,Weihao Wan,Yuha Lu,Feifei Feng

2017.12.25

11

Used for laser spot size continuously adjustable focusing optical path system and adjustment method

CN201810730497.0

Yunhai;Jia Liu;Peng Xu;Xiaoxia Shi;Rui Shen;Xiaopeng Li

2018.7.5

12

An instrument and method for rapid analysis of inclusions across scales based on microphotographic matrix

CN201811131502.2

Yunhai Jia;Jingliang Yuan;Jiwen Chen;Chun Yang;Lei Yu;Qiao Chu

2018.9.27

13

A method for quantitative characterization of the area and content of different types of inclusions in steel

CN201810952853.3

Yun hai Jia;Jia Liu;Chun Yang;Xuejing Shen;Rui Shen;Peng Xu;Xiaoxia Shi

2018.8.21

14

Combined current and sacrificial anode protection devices for jacket platforms and methods

CN201810043594.2

Pengfei Yin;Wei Zhang;Bing Han;Xiangyang Li;Zhijian Zheng;Changjiang Ma;Yalin Chen

2018.1.17

15

An experimental system for loading tube samples with internally flowing supercritical water is introduced

CN201710946635.4

Yonghao Lu,Yanguang Liu,Xianfei Ding,Gong Chen,Zhexiong Zhuangzi,Dongbai Sun

2017.10.12

16

A large - scale micrograph generation method based on BBB 0 definition fusion is presented

CN201810432523.1

Haiyou Huang,Xiaojuan Ban,Ya Su,Wanbo Liu,Boyuan Ma,Wenhui Chen,Yulian Chen,Chuni Liu

2018.05.08

17

The invention relates to a low-energy scanning electron microscope system and a sample detection method

CN201711168539.8

Shuai Li、Wei He

2017.11.21

18

Low energy scanning electron microscope system, scanning electron microscope system and sample detection method

CN201811250972.0

Shuai Li、Wei He

2018.10.25

19

The invention discloses a scanning electron microscope system and a sample detection method

CN201810589383.9

Shuai LI 、Wei He、Ruiping Wang

2018.6.8

20

The invention relates to an imaging system and a sample detection method

CN201810837831.2

Wei he、Shuai

2018.7.26

 


                          

版权所有©北京科技大学 建设与技术支持:信息化建设与管理办公室 京公网安备:110402430062 京ICP备:13030111